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Int’l symposium on OIML certification runs in Shanghai

Source : chinadaily.com.cnUpdate : 2017-06-19

The new OIML certification system symposium opened in Shanghai on June 15.

More than 400 experts, officials and business representatives from Chinese and overseas metrology research institutes, associations, manufacturers and suppliers attended the world event. The attendees included Wu Qinghai, vice-minister of the General Administration of Quality Supervision, Inspection, and Quarantine (AQSIQ), Xu Kunlin, vice-mayor of Shanghai Municipal Government, Roman Schwartz, first vice-president of the International Organization of Legal Metrology (OIML), Gregor Dudle, a member of the chairperson’s group of the European Cooperation Committee in Legal Metrology (WELMEC), and Dr. Peter Ulbig, who is vice-president of the Euro-Asian Cooperation of National Metrological Institutions (COOMET).


AQSIQ Vice-Minister Wu Qinghai (sixth from left) and OIML Vice-President Roman Schwartz (fifth from left) pose for an official photo with major attendees at the symposium. [Photo provided to China Daily]

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Wu Qingahai addresses the opening ceremony. [Photo provided to China Daily]

Wu Qinghai, said the metrology sector played a critical role in improving national infrastructure and the mutual acceptance arrangement (MAA) was important for reducing trade barriers, enhancing international trust and boosting economic globalization. 

Wu said MAA was considered an essential way to facilitate inter-connected ties among world traders in the metrology field. It demands joint efforts from OIML, the Convention du Metre (BIPM), the International Laboratory Accreditation Cooperation (ILAC), the International Accreditation Forum (IAF), and the International Organization for Standardization (ISO). 

Wu also pointed out that the symposium, themed to promote international coordination and upgrading of the metrology industry, was planning extensive further talks on the significance of the OIML certificate and the MAA system, and on reinforcing the great impacts of the certificate and the MAA. 

Wu emphasized through the MAA seminar the aim of encouraging measuring instrument businesses to conduct studies, production, sales and application of measuring tools in accordance with OIML and ISO’s guidelines and rules. 

He said his hope was that China would step forward and meet international norms, and promise to join world organizations to continue improving the global system of legal metrology. 

Xu Kunlin, Shanghai’s vice-mayor, said the OIML certification system helped to lessen technical barriers, improve operating efficiency and decrease time and costs consumed in global measuring device transactions. 

Xu said Shanghai enjoyed a location advantage by being the intersection of the Belt and Road Initiative and the Yangtze River Economic Zones. He said this helped to increase mutual acceptance, restructuring and upgrading in the metrology industry, and in promoting “Brand China” to the world.  

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Roman Schwartz speaks at the meeting. [Photo provided to China Daily]

Schwartz said the new OIML certification system will help reduce unnecessary procedures in testing measurement instruments and create uniform and widely recognized frameworks among OIML member countries and corresponding members. 

The new OIML mutual acceptance certification system will be implemented on Jan 1, 2018.