World legal metrology associations investigate SIMT
Tao Yonghua, deputy director of the Shanghai Municipal Bureau of Quality and Technical Supervision, hosted a reception for delegates from a variety of global metrology organizations visiting the Shanghai Institute of Measurement and Testing Technology on April 5.
The group of international visitors was led by Roman Schwartz, vice president of the International Organization of Legal Metrology (OILM) and vice president of Germany’s national metrology institute, the Physikalisch-Technische Bundesanstalt, as well as Roland Nater, chairman of the International Cooperation Group of the European Weighing Apparatus Association.
The visiting delegation first made a field investigation tour around the important laboratories for metrological study at the SIMT. Schwartz spoke highly of SIMT’s accomplishments in research and industrial practices.
Afterwards, a meeting was held at the institute to further exchanges between the two sides.
Shao Li, director of the SIMT, delivered a report about the institute to the delegation. Shao expressed great thanks to PTB for its longstanding partnership with SIMT and its assistance in helping SIMT build up its facilities to measure gas flows. He also gave an update on SIMT’s efforts and attainments regarding OIML system and certificates.
Schwartz praised SIMT for its role in OIML’s work in China and put forward his proposals to upgrade SIMT’s OIML certificates. He expressed his hope for further talks with SIMT on the new OIML certificates during the OIML-CS conference, which will take place in Shanghai this June. Schwartz also asked about SIMT’s current research projects and how to integrate scientific research with detection services. He said his expected the two sides to increase cooperation and exchanges in the future.
Both sides emphasized the importance of the “Made in China 2025” plan and Germany’s Industry 4.0 concept, and said they should combine to propel the progress of two countries’ facilities in quality monitoring technology.
Tao Yonghua (second from right), deputy director of the Shanghai Municipal Bureau of Quality and Technical Supervision, hosts a reception for an international delegation in the Shanghai Institute of Measurement and Testing Technology on April 5. [Photo from simt.com.cn]
The two sides hold discussions in the meeting hosted in the Shanghai Institute of Measurement and Testing Technology. [Photo from simt.com.cn]